eDAQ Systems – Data Recording Systems

eDAQ manufactures e-corder and powerchrom data recording systems for electrochemistry, chromatography, flow analysis, research and teaching.

eDAQ Systems – Data Recording Systems

The Mega Teaching Kit includes all the hardware, software, electrodes and transducers required to quickly develop a wide range of exciting experiments for chemistry and biochemistry laboratory courses.

ER462 Mega Teaching Kit - eDAQ Product

The Kit includes

  • ED410 e-corder 410 (including Chart and Scope software)
  • EA163 Potentiostat
  • pH & ISE, Conductivity, and Thermocouple isoPods
  • ES260 EChem Software
  • ET014 EChem Electrode Kit
  • Drop Counter and Pulse Transducer.
  • Oxygen Electrode, pH Electrode,
  • Conductivity Probe and T-type Thermocouple Probe

ER462 Mega Teaching Kit – eDAQ Product

Teradyne – Automatic Test Equipment

Leading supplier of Automatic Test Equipment. Divisions are Assembly Test, Semiconductor Test, and Vehicle Diagnostic Solutions.Teradyne - Automatic Test Equipment - Teradyne

Teradyne – Automatic Test Equipment

ATD’s Products and services include: In-Circuit Board Test Systems, Functional Test Platforms, Automated X-Ray Inspection etc.

Semiconductor test solutions for developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as cells in system-on-a-chip (SOC) devices.

Seen on right is a microFLEX a Cost-efficient test solution ideal for analog, digital and mixed-signal System-on-a-Chip (SoC) and System-in-Package (SiP) device testing.

Automatic Testing Equipment – HIOKI

Used for inspecting electronic circuit boards and IC packages. These equipment are used for Pass-Fail testing of printed circuit boards and IC packaging used in a variety of electronic devices.

Automatic Testing Equipment - HIOKI

Automatic Testing Equipment – HIOKI

Flying probe type testers – 1116, 1117, 1270

The 1116 is a high-speed pattern tester that uses the capacitance testing method.

The 1117 and 1270 are double-sided board testers capable of pattern testing using the capacitance testing method as well as IVH low-resistance testing.

Features Include

  • IVH (interstitial via hole) and through hole resistance measurement
  • High-resolution capacitance measurement of 5 aF (1 aF = 10-18F)
  • High-precision probing
  • Simple basic data acquisition
  • High-resistance short detection using capacitance measurement
  • 4-terminal resistance measurement function
  • L/C/R measurement function

Flying probe type testers – 1116, 1117, 1270

X-Y Board HiTESTER 1117 – HIOKI